Compatibility test specification for the next-generation USB, “USB 3.0,” will be formulated as early as the first half of 2009.
According to Agilent Technologies Inc, which is engaged in the formulation of the test specification, the “Test Specification 1.0” is planned to be released at the end of June 2009. This was announced by Jim Choate, Agilent’s USB Applications Product Manager, during a seminar titled “USB 3.0 - The Impact of SuperSpeed USB” in Tokyo March 6, 2009.
Compatibility tests for transmitting circuits and receiving circuits will begin in the second half of 2009, he said. After that, USB Implementers Forum Inc (USB-IF) will have its first “compliance workshop” at about the end of 2009. And USB 3.0-compatible end products certified by USB-IF are expected to debut in 2010.
Also, Choate said USB-IF is planning a meeting for USB 3.0 developers in Tokyo in late May 2009.